Description

• The Zenith AOI Series is the only solution in the industry to base its inspection criteria according to the IPC-610 standards for electronic assembly acceptability requirements.
  
• Koh Young’s quantitative True 3D measurement-based approach allows a wider inspection coverage including advanced tall component inspection
  
• Delivers clear and precise AOI measurement to accurately identify multiple defects such as missing solder, offset, polarity, upside down, OCV/OCR, solder fillet, billboarding, lifted lead, lifted body, tombstone, bridging, and more.
  
• Zenith 2’s powerful side-view camera option quickly identifies, measures, and analyzes potential defects on hidden or obscured components
  
• The Zenith 2 overcomes component shadow challenges based on incorporating multi-projection Moiré interferometry system and handles components up to 25mm tall.